Download An Introduction to Mixed-Signal Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns PDF

By Gordon Roberts, Friedrich Taenzler, Mark Burns

Built-in circuits incorporating either electronic and analog capabilities became more and more regular within the semiconductor undefined. Mixed-signal IC try and size has grown right into a hugely really expert box of electric engineering. even if, try out engineering continues to be a comparatively unknown occupation in comparison to IC layout engineering.

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Extra info for An Introduction to Mixed-Signal Test and Measurement

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Resolution is sometimes listed as a typical specification, but only as a means of formally communicating the number of DAC input bits. The TYP column is also used to list characterization data for parametersthat are difficult or impossible to measure in a cost-effective manner. For example, input capacitanceis often listed as a typical specification becauseit is largely dominated by the design layout and by the device package. In cases such as this, characterization data can be collect~d from many devices to prove that the parameter never fails and therefore does not need to be testedin production.

3V Reference voltage, Vref . . . . . . . . . . . . . . . . , , . . ... .. . . . . . . . . . :1:25 V Peakdigital input current,II , Operatingfree-airtemperaturerange,TA: 101JA TLC7524C TLC75241 TLC7524E StDragetemperaturerange,Tstg Casetemperaturefor10seconds,TC:FNpackage , Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: 0 or N package ~ 0°Cto70°C -25°C to 85°C -40°Cto85"C -65°Cto150"C , 260°C 260°C TEXAS INSTRUMENTS 2 . POSTOFFK:EBOX655303 DAlLAS.

Another problem facing mixed-signal test engineers is correlation between the answers given by different pieces of measurementhardware. The customer or design engineer often finds that the test program results do not agree with measurementstaken using bench equipment in their lab. The test engineer must determine which answer is correct and why there is a discrepancy. It is also common to find that two supposedly identical testers or DIB boards give different answers or that the same tester gives different answers from day to day.

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